• DocumentCode
    107778
  • Title

    Finite Element Analysis of Ring-on-Ring Test on LCD Panels

  • Author

    Vepakomma, K.H. ; Westbrook, Jamie ; Carley, Stephen ; Jum Kim

  • Author_Institution
    Corning Inc., Corning, NY, USA
  • Volume
    9
  • Issue
    8
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    673
  • Lastpage
    677
  • Abstract
    The ring-on-ring test is one of the most popular surface strength testing methods used to test LCD panels. This paper uses finite element analysis to show that a panel behaves like two independent pieces of glass during a ring-on-ring test. The epoxy region where the color filter and thin-film transistor (TFT) glasses are glued together does not affect the stress at the center. As LCD panels get thinner, the contribution of membrane stress increases significantly. Because the color filter and TFT glasses act independently, they experience maximum principal stresses within 15% of each other. For deflections greater than one-half (sometimes one-fourth) the glass thickness, the stresses are not uniform inside the load ring, requiring finite element analysis to obtain an accurate stress distribution.
  • Keywords
    colour displays; finite element analysis; liquid crystal displays; membranes; optical filters; optical glass; stress analysis; thin film transistors; LCD panel testing; TFT; color filter; epoxy region; finite element analysis; maximum principal stress; membrane stress distribution; ring-on-ring testing; surface strength testing method; thin-film transistor glass; Ceramics; Finite element analysis; Glass; Stress; System-on-chip; Testing; Thin film transistors; Finite element analysis; LCD panel; ROR; ring-on-ring (ROR) test; surface strength testing; thin glass;
  • fLanguage
    English
  • Journal_Title
    Display Technology, Journal of
  • Publisher
    ieee
  • ISSN
    1551-319X
  • Type

    jour

  • DOI
    10.1109/JDT.2013.2251744
  • Filename
    6487419