Finite element analysis for lossy optical waveguides by using perturbation techniques

Author

Themistos, C. ; Rahman, B.M.A. ; Grattan, K.T.V.

Author_Institution

Dept. of Electr. Electron. & Inf. Eng., City Univ., London, UK

Volume

6

Issue

4

fYear

1994

fDate

4/1/1994 12:00:00 AM

Firstpage

537

Lastpage

539

Abstract

A finite element analysis, based on the variational procedure, is used to find the modal loss or gain for both the TE and TM modes with the application of the perturbation technique. Results for the modal gain for the buried heterostructure diode laser are presented, as well as the loss estimation for both the TE and TM modes for the asymmetrical multilayer metal-clad planar optical waveguides. The results obtained agree very well, for a wide range of loss/gain values, with the previously published work using alternative approaches.<>

Keywords

finite element analysis; integrated optics; optical waveguide theory; optical waveguides; perturbation theory; TE modes; TM modes; asymmetrical multilayer metal-clad planar optical waveguides; buried heterostructure diode laser; finite element analysis; loss estimation; lossy optical waveguides; modal gain; modal loss; perturbation techniques; variational procedure; Eigenvalues and eigenfunctions; Equations; Finite element methods; Nonlinear optics; Optical losses; Optical refraction; Optical variables control; Optical waveguides; Perturbation methods; Tellurium;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.281819

Filename

281819