• DocumentCode
    1078407
  • Title

    Transition metal-gate MOS gaseous detectors

  • Author

    Poteat, T.L. ; Lalevic, Bogoljub

  • Author_Institution
    Bell Laboratories, Murray Hill, NJ
  • Volume
    29
  • Issue
    1
  • fYear
    1982
  • fDate
    1/1/1982 12:00:00 AM
  • Firstpage
    123
  • Lastpage
    129
  • Abstract
    MOS capacitors with gates of palladium, platinum, and nickel are shown to be sensitive detectors of H2, CH4, C4H10, and CO gases. 1-MHz and 10-Hz C-V characteristics change by - 1240 and - 215 mV when the Pd-gate MOS capacitor is exposed to H2gas at 760 and 2 × 10-8torr, respectively. Platinum-gate MOS capacitors exhibit approximately one-half the change of Pd-gate devices. Nickel shows a response of - 120 and - 140 mV in 1 atm of H2find CO gas, respectively. When the capacitors are operated in a constant-capacitance mode by varying the bias, absorption time characteristics are obtained. Pd-gate devices absorb H2gas in 190-200 ms at 760 torr of H2but require 200 min to reach 63 percent of the total change at 2 × 10-8torr H2pressure. Both Pt- and Ni-gate devices are slower than Pd. The detection mechanism is attributed to the change in work function upon hydrogen absorption. This is established by demonstrating no change either in the density of interface states or in the distribution across the gap or in the number of states at midgap upon absorption. Also, no accumulation of additional charges in the SiO2or Si3N4dielectric is found upon hydrogenation of devices with either Pd or Pt gates.
  • Keywords
    Absorption; Capacitance-voltage characteristics; Gas detectors; Gases; Hydrogen; Interface states; MOS capacitors; Nickel; Palladium; Platinum;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1982.20668
  • Filename
    1482165