DocumentCode
1078765
Title
An impedance measurement method for double-gap klystron cavity
Author
Zhao, Yong-Xiang
Author_Institution
Stanford University, Stanford, CA
Volume
29
Issue
2
fYear
1982
fDate
2/1/1982 12:00:00 AM
Firstpage
316
Lastpage
320
Abstract
A new method has been developed for measuring the impedance of a two-gap cavity used in high-power klystrons. The principle is based on network analysis. The cavity under test is considered as a microwave network. The two gaps of the cavity and its output terminal are referred to as three ports. We then can use an impedance matrix to characterize this system, and the six independent impedance parameters can be found by measuring the input impedance seen from the output waveguide when the gaps are in different conditions; viz., either open, shorted, or perturbed. The gap impedance then can be deduced therefrom. It is shown that there are three impedances for a double-gap cavity instead of one for a single-gap cavity. Another problem dealt with here is how to evaluate the capacitance introduced by the perturbation. A few typical experimental results are presented.
Keywords
Capacitance; Equations; Impedance measurement; Klystrons; Q measurement; Resonance; Testing; Transmission line matrix methods; Voltage; Waveguide discontinuities;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1982.20702
Filename
1482199
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