• DocumentCode
    1078765
  • Title

    An impedance measurement method for double-gap klystron cavity

  • Author

    Zhao, Yong-Xiang

  • Author_Institution
    Stanford University, Stanford, CA
  • Volume
    29
  • Issue
    2
  • fYear
    1982
  • fDate
    2/1/1982 12:00:00 AM
  • Firstpage
    316
  • Lastpage
    320
  • Abstract
    A new method has been developed for measuring the impedance of a two-gap cavity used in high-power klystrons. The principle is based on network analysis. The cavity under test is considered as a microwave network. The two gaps of the cavity and its output terminal are referred to as three ports. We then can use an impedance matrix to characterize this system, and the six independent impedance parameters can be found by measuring the input impedance seen from the output waveguide when the gaps are in different conditions; viz., either open, shorted, or perturbed. The gap impedance then can be deduced therefrom. It is shown that there are three impedances for a double-gap cavity instead of one for a single-gap cavity. Another problem dealt with here is how to evaluate the capacitance introduced by the perturbation. A few typical experimental results are presented.
  • Keywords
    Capacitance; Equations; Impedance measurement; Klystrons; Q measurement; Resonance; Testing; Transmission line matrix methods; Voltage; Waveguide discontinuities;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1982.20702
  • Filename
    1482199