DocumentCode
1078997
Title
Computer modeling of diode forward recovery characteristics
Author
Root, C. David ; Melillo, J. ; Sammon, S.
Author_Institution
Raytheon Company, Sudbury, MA
Volume
29
Issue
3
fYear
1982
fDate
3/1/1982 12:00:00 AM
Firstpage
461
Lastpage
463
Abstract
Ebers-Moll based computer models for diodes cannot accurately represent forward recovery characteristics. This occurs because the model is basically a modified RC network, while the forward recovery behavior is essentially inductive. The situation may be corrected using an Ebers-Moll modeled transistor, which shunts a resistor in series with the diode. The transistor is initially off, so there is a large voltage drop across the resistor. When the transistor turns on, the voltage drop is limited by the saturation voltage of the transistor. When properly modeled, excellent agreement with experimental data was found, and no detrimental effects on other simulated diode characteristics resulted.
Keywords
Capacitance; Circuit testing; Computational modeling; Computer simulation; Diodes; Equations; Impedance; Pulse modulation; Resistors; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1982.20724
Filename
1482221
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