• DocumentCode
    1078997
  • Title

    Computer modeling of diode forward recovery characteristics

  • Author

    Root, C. David ; Melillo, J. ; Sammon, S.

  • Author_Institution
    Raytheon Company, Sudbury, MA
  • Volume
    29
  • Issue
    3
  • fYear
    1982
  • fDate
    3/1/1982 12:00:00 AM
  • Firstpage
    461
  • Lastpage
    463
  • Abstract
    Ebers-Moll based computer models for diodes cannot accurately represent forward recovery characteristics. This occurs because the model is basically a modified RC network, while the forward recovery behavior is essentially inductive. The situation may be corrected using an Ebers-Moll modeled transistor, which shunts a resistor in series with the diode. The transistor is initially off, so there is a large voltage drop across the resistor. When the transistor turns on, the voltage drop is limited by the saturation voltage of the transistor. When properly modeled, excellent agreement with experimental data was found, and no detrimental effects on other simulated diode characteristics resulted.
  • Keywords
    Capacitance; Circuit testing; Computational modeling; Computer simulation; Diodes; Equations; Impedance; Pulse modulation; Resistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1982.20724
  • Filename
    1482221