• DocumentCode
    1079342
  • Title

    Modification of engineering return-stroke models to include dispersion effects

  • Author

    Yang, Chunshan ; Zhou, Bihua ; Shi, Lihua ; Gao, Cheng

  • Author_Institution
    EMP Lab., Eng. Instn., Najing, China
  • Volume
    46
  • Issue
    3
  • fYear
    2004
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    Recently, Baba and Ishii (see ibid., vol.44, p.476-7, Aug. 2002) have presented a method to modify the transmission-line (TL) type model to incorporate current distortion. In this brief, we generalize their method, as well as an exponential decay return stroke speed model, to simple engineering return-stroke models, and investigate the influence of dispersion effects on associated electromagnetic fields. Results show that the proposed modification to the models eliminates the inherent discontinuity in the traveling current source (TCS) model and the Bruce-Golde (BG) model at the upward-moving front. In addition, it turns out that an increase in the current risetime with height does not have significant effect on magnetic hump, electric ramp, and distant zero crossing, while a rapid decrease in return stroke speed with height could affect these features.
  • Keywords
    electromagnetic fields; electromagnetic pulse; lightning; transmission line theory; Bruce-Golde model; TCS model; current distortion; dispersion effects; distant zero crossing; electric ramp; electromagnetic fields; engineering return-stroke models; exponential decay return stroke speed model; lighting electromagnetic pulse; lightning return stroke; magnetic hump; transmission-line type model; traveling current source model; Dispersion; EMP radiation effects; Electromagnetic fields; Electromagnetic measurements; Electromagnetic modeling; Magnetic field measurement; Mathematical model; Optical attenuators; Optical distortion; Transmission line measurements; Lightning; lighting electromagnetic pulse; return-stroke model;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2004.831909
  • Filename
    1325805