DocumentCode
1079871
Title
Double gate-MOSFET subthreshold circuit for ultralow power applications
Author
Kim, Jae-Joon ; Roy, Kaushik
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
51
Issue
9
fYear
2004
Firstpage
1468
Lastpage
1474
Abstract
In this paper, we propose MOSFETs that are suitable for subthreshold digital circuit operations. The MOSFET subthreshold circuit would use subthreshold leakage current as the operating current to achieve ultralow power consumption when speed is not of utmost importance. We derive the theoretical limit of delay and energy consumption in MOSFET subthreshold circuit, and show that devices that have an ideal subthreshold slope are optimal for subthreshold operations due to the smaller gate capacitance, as well as the higher current. The analysis suggests that a double gate (DG)-MOSFET is promising for subthreshold operations due to its near-ideal subthreshold slope. The results of our investigation into the optimal device characteristics for DG-MOSFET subthreshold operation show that devices with longer channel length (compared to minimum gate length) can be used for robust subthreshold operation without any loss of performance. In addition, it is shown that the source and drain structure of DG-MOSFET can be simplified for subthreshold operations since source and drain need not be raised to reduce the parasitic resistance.
Keywords
MOSFET; leakage currents; logic circuits; low-power electronics; CMOS subthreshold logic; MOSFET sub-threshold circuit; digital circuit operations; double gate-MOSFET; energy consumption; gate capacitance; gate length; leakage current; operating current; parasitic resistance; subthreshold circuit; subthreshold slope; ultralow power applications; ultralow power consumption; CMOS technology; Capacitance; Circuits; Delay; Energy consumption; Frequency; Leakage current; MOSFETs; Subthreshold current; Threshold voltage; -MOSFET; CMOS subthreshold logic; DG; double gate; leakage current; subthreshold slope; ultralow power;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2004.833965
Filename
1325852
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