• DocumentCode
    1079871
  • Title

    Double gate-MOSFET subthreshold circuit for ultralow power applications

  • Author

    Kim, Jae-Joon ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    51
  • Issue
    9
  • fYear
    2004
  • Firstpage
    1468
  • Lastpage
    1474
  • Abstract
    In this paper, we propose MOSFETs that are suitable for subthreshold digital circuit operations. The MOSFET subthreshold circuit would use subthreshold leakage current as the operating current to achieve ultralow power consumption when speed is not of utmost importance. We derive the theoretical limit of delay and energy consumption in MOSFET subthreshold circuit, and show that devices that have an ideal subthreshold slope are optimal for subthreshold operations due to the smaller gate capacitance, as well as the higher current. The analysis suggests that a double gate (DG)-MOSFET is promising for subthreshold operations due to its near-ideal subthreshold slope. The results of our investigation into the optimal device characteristics for DG-MOSFET subthreshold operation show that devices with longer channel length (compared to minimum gate length) can be used for robust subthreshold operation without any loss of performance. In addition, it is shown that the source and drain structure of DG-MOSFET can be simplified for subthreshold operations since source and drain need not be raised to reduce the parasitic resistance.
  • Keywords
    MOSFET; leakage currents; logic circuits; low-power electronics; CMOS subthreshold logic; MOSFET sub-threshold circuit; digital circuit operations; double gate-MOSFET; energy consumption; gate capacitance; gate length; leakage current; operating current; parasitic resistance; subthreshold circuit; subthreshold slope; ultralow power applications; ultralow power consumption; CMOS technology; Capacitance; Circuits; Delay; Energy consumption; Frequency; Leakage current; MOSFETs; Subthreshold current; Threshold voltage; -MOSFET; CMOS subthreshold logic; DG; double gate; leakage current; subthreshold slope; ultralow power;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2004.833965
  • Filename
    1325852