• DocumentCode
    1080029
  • Title

    Interaction Between Negative and Positive Index Medium Waveguides

  • Author

    Yan, Wei ; Shen, Linfang ; Yuan, Yu ; Yang, Tzong Jer

  • Author_Institution
    Dept. of Inf. & Electron. Eng., Zhejiang Univ., Hangzhou
  • Volume
    26
  • Issue
    21
  • fYear
    2008
  • Firstpage
    3560
  • Lastpage
    3566
  • Abstract
    The coupling between negative and positive index medium waveguides is investigated theoretically in this paper. A coupled mode theory is developed for such a waveguide system and its validity is verified. Interesting phenomena in the coupled waveguides are demonstrated, which occur in the case when the negative index medium waveguide in isolation guides its mode backward. A new type of coupled mode solution that varies exponentially with the coupling length is found in the special case when the propagation constants of two individual waveguides are nearly the same. A coupler operating in this case is insensitive to the coupling length, and its coupling efficiency can reach 100% as long as the coupling length is long enough. However, when the propagation constants of the two individual waveguides differ greatly, the coupled mode solution is still a periodic function of the coupling length, but the coupled power is output backward. In addition, the modes in the composite waveguide system are also studied using the coupled mode theory, and their fundamental properties are revealed.
  • Keywords
    optical planar waveguides; backward waves; coupled mode theory; coupled waveguides; negative index medium waveguides; positive index medium waveguides; propagation constants; Electromagnetic waveguides; Optical planar waveguides; Optical refraction; Optical resonators; Optical waveguides; Planar waveguides; Propagation constant; Slabs; Waveguide components; Waveguide theory; Backward waves; coupled mode theory; negative index media (NIM); waveguides;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.917312
  • Filename
    4758645