• DocumentCode
    1081764
  • Title

    Dynamic reliability analysis of coherent multistate systems

  • Author

    Xue, Jianan ; Yang, Kai

  • Author_Institution
    Dept. of Manuf. & Ind. Eng., Wayne State Univ., Detroit, MI, USA
  • Volume
    44
  • Issue
    4
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    683
  • Lastpage
    688
  • Abstract
    This paper generalizes 2-state (binary-state) reliability parameters `R(t), F(t), λ(t), and mean-time to-failure´ to multi-state reliability parameters `R(t,i), G(t,i), λ(t,i), mean-life-span-at-specified-performance-level(i), for each state´. By using these generalized reliability parameters, multi-state reliability dynamic analysis can be transformed to a set of 2-state reliability dynamic analyses. Then, the authors extend some theoretical results in 2-state reliability analysis to the multi-state case. Measures for evaluating performance degradation of multi-state system are developed. By combining Markov processes and s-coherent multi-state system structure functions, the dynamic multi-state reliability can be analyzed. Several examples are given
  • Keywords
    Markov processes; failure analysis; reliability theory; Markov processes; binary-state reliability parameters; coherent multistate systems; dynamic reliability analysis; mean-life-span-at-specified-performance-level; mean-time to-failure; multi-state reliability parameters; performance degradation; s-coherent multi-state system structure functions; two-state reliability parameters; Degradation; Failure analysis; Markov processes; Performance analysis; Reliability theory;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.476002
  • Filename
    476002