• DocumentCode
    1082637
  • Title

    Magnetic and morphological characterization of SrMe2-W and SrZn-X hexaferrites prepared by chemical coprecipitation method

  • Author

    Leccabue, F. ; Salviati, G. ; Almodvar, N.S. ; ALbanese, G. ; Leo, G.

  • Author_Institution
    MASPEC/CNR Inst., Parma, Italy
  • Volume
    24
  • Issue
    2
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    1850
  • Lastpage
    1852
  • Abstract
    Polycrystalline samples of SrMe2Fe16O27 (SrMe2-W) with Me2+=Zn, Co, Ni, Mn, Mg, Cu, and Sr2Zn2Fe28O46 (SrZn-X) hexagonal ferrites have been prepared by the chemical coprecipitation method. The main steps of W- and X-phase formation have been evidenced by means of Mossbauer spectroscopy, X-ray diffraction techniques, scanning electron microscopy, and thermal magnetic analysis. The intrinsic and extrinsic magnetic properties of the samples (saturation magnetization, anisotropy field, coercive field, and Curie temperature) and the morphological characterization are reported.
  • Keywords
    Curie temperature; Mossbauer effect; X-ray diffraction examination of materials; coercive force; crystal morphology; ferrites; magnetic anisotropy; magnetisation; magnetocaloric effects; scanning electron microscope examination of materials; strontium compounds; Curie temperature; Mossbauer spectroscopy; Sr2Zn2Fe28O46; SrCo2Fe16O27; SrCu2Fe16O27; SrMg2Fe16O27; SrMn2Fe16O27; SrNi2Fe16O27; SrZn2Fe16O27; X-phase formation; X-ray diffraction; anisotropy field; chemical coprecipitation method; coercive field; extrinsic magnetic properties; hexaferrites; hexagonal ferrites; intrinsic magnetic properties; morphological characterization; polycrystalline; saturation magnetization; scanning electron microscopy; thermal magnetic analysis; Chemicals; Ferrites; Iron; Magnetic anisotropy; Perpendicular magnetic anisotropy; Saturation magnetization; Spectroscopy; Strontium; X-ray diffraction; Zinc;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.11623
  • Filename
    11623