High Q-value resonators for the SHF-region based on TBCCO-films

Author

Manzel, Martin ; Huber, Stefan ; Bruchlos, Hans ; Bornmann, S. ; Görnert, Peter ; Klinger, Martin ; Stiller, Michael

Author_Institution

Inst. fur Phys. Hochtechnol., Jena, Germany

Volume

44

Issue

7

fYear

1996

fDate

7/1/1996 12:00:00 AM

Firstpage

1382

Lastpage

1384

Abstract

We used a sapphire dielectric resonator with a copper cylindrical shield and two endplates replaced by HTS layers for very accurate surface resistance measurements of TBCCO films made by the two step method. This technique allows for the preparation of high quality 2-in diameter Tl-2223 superconducting films with surface resistance values (R _s) smaller than 100 μΩ at 5.6 GHz and 77 K. The use of these films in sapphire dielectric resonators yields resonators for the C-band with very high unloaded quality factors (Q_o>2×10⁶ at 77 K). Such high Q_o-values are not reached with any conventional resonators of comparable size

Keywords

Q-factor; dielectric resonators; electromagnetic shielding; electron device manufacture; high-temperature superconductors; sapphire; sputter deposition; sputtered coatings; superconducting microwave devices; superconducting thin films; 5.6 GHz; 77 K; Al₂O₃; C-band; Cu; Cu cylindrical shield; HTS layers; SHF-region; TBCCO-films; TlBaCaCuO; high Q-value resonators; quality factors; sapphire dielectric resonator; superconducting films; surface resistance; Atomic force microscopy; Dielectrics; Electrical resistance measurement; High temperature superconductors; Q factor; Scanning electron microscopy; Superconducting films; Superconducting microwave devices; Surface morphology; Surface resistance;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.508244

Filename

508244