Photon induced noise in the SIS detector

Author

Dubash, Noshir B. ; Pance, Gordana ; Wengler, Michael J.

Author_Institution

Dept. of Electr. Eng., Rochester Univ., NY, USA

Volume

42

Issue

4

fYear

1994

fDate

4/1/1994 12:00:00 AM

Firstpage

715

Lastpage

725

Abstract

The dominant source of noise in an SIS mixer is the noise in the photon-induced current. We have made accurate measurements of noise induced in SIS junctions by 95 GHz photons. The noise is measured at 1.5 GHz using a low-noise cryogenic measurement system. The measured photon-induced noise is compared to the noise predicted by Tucker´s theory augmented by a vacuum/thermal noise term. For small to moderate rf powers, at which SIS mixers are operated, the measured noise is nearly perfectly predicted by this theory for all the devices measured. Measurements of series arrays of SIS junctions also agree with this theory showing that the noise of each SIS junction in the array is independent. At large rf powers, the measured noise was higher than the predicted noise, in devices with smaller capacitance. We also measured the noise in single junctions and arrays with no rf radiation. These measurements agreed very well with the predicted shot noise for most bias conditions

Keywords

electron device noise; microwave detectors; mixers (circuits); random noise; superconducting junction devices; 1.5 GHz; 95 GHz; 95 GHz photons; SIS detector; SIS junction series arrays; SIS mixer; Tucker´s theory; accurate measurements; bias conditions; dominant noise source; low-noise cryogenic measurement system; measured noise; measured photon-induced noise; photon induced noise; photon-induced current; predicted noise; rf powers; shot noise; smaller capacitance; vacuum/thermal noise term; Acoustic reflection; Capacitance measurement; Cryogenics; Detectors; Gain measurement; Noise measurement; Power measurement; Superconducting device noise; Switches; Temperature;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.285086

Filename

285086