Power-supply current diagnosis of VLSI circuits

Author

Frenzel, James F.

Author_Institution

Dept. of Electr. Eng., Idaho Univ., Moscow, ID, USA

Volume

43

Issue

1

fYear

1994

fDate

3/1/1994 12:00:00 AM

Firstpage

30

Lastpage

38

Abstract

This paper presents a technique based upon the power supply current signature (PSCS) which allows testing of mixed-signal systems, in situ. The PSCS contains important information concerning the operational status of the system; such information can be extracted using approaches based on statistical signal detection theory. The fault-detection performance of these techniques is superior to that achieved through autoregressive modeling of the PSCS. These methods are suitable for production testing of cost-sensitive devices and field testing of mission-critical systems

Keywords

VLSI; electric current measurement; fault currents; fault location; integrated circuit testing; power supplies to apparatus; production testing; signal detection; VLSI circuits; cost-sensitive devices; fault-detection performance; field testing; in situ testing; mission-critical systems; mixed-signal systems; operational status; power-supply current diagnosis; production testing; statistical signal detection theory; Circuit faults; Circuit testing; Current supplies; Data mining; Mission critical systems; Power supplies; Production systems; Signal detection; System testing; Very large scale integration;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.285105

Filename

285105