DocumentCode
1084079
Title
Electric field distributions in planar transferred-electron devices measured with picosecond optical pulses
Author
Carruthers, T.F. ; Weller, J.F. ; Binari, S.C. ; Thompson, P.E.
Author_Institution
Naval Research Laboratory, Washington, DC
Volume
3
Issue
11
fYear
1982
fDate
11/1/1982 12:00:00 AM
Firstpage
347
Lastpage
349
Abstract
The internal static electric field distribution in InP planar transferred-electron devices at subthreshold biases has been measured with a spatial resolution of 1.5 µm by observing the photoconductive current response to picosecond optical pulses. The technique is extremely sensitive to fields in the vicinity of electron velocity saturation values.
Keywords
Cathodes; Electric variables measurement; Indium phosphide; Optical beams; Optical pulse generation; Optical pulses; Photoconductivity; Plasma measurements; Probes; Pulse measurements;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1982.25596
Filename
1482701
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