Effects of grain isolation on magnetic properties of c-axis uniaxially in-plane oriented barium hexaferrite thin films

Author

Chen, Yingjian ; Sui, Xiaoyu ; Kryder, Mark H.

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

32

Issue

4

fYear

1996

fDate

7/1/1996 12:00:00 AM

Firstpage

3313

Lastpage

3318

Abstract

Magnetic properties of c-axis uniaxially in-plane aligned Ba-ferrite thin films were studied. Ba-ferrite thin films on [110] a-plane single-crystal sapphire substrates were deposited by low-power RF diode sputtering. Different degrees of grain isolation were achieved via postdeposition annealing at various temperatures in a rapid thermal annealing furnace. In this study, a magnetic evaluation of intergranular interaction was carried out using the well-established remanent magnetization ΔM curve. The results presented indicate a positive magnetostatic interaction, the strength of which is correlated with grain separation when measured along the magnetic easy axis direction. A predominant negative magnetostatic interaction was observed when measured along the magnetic hard axis direction, the magnitude of which is relatively independent of further grain separation

Keywords

barium compounds; ferrites; magnetic thin films; rapid thermal annealing; remanence; sputtered coatings; BaFe₁₂O₁₉; [110] a-plane single-crystal sapphire substrate; c-axis uniaxially in-plane oriented barium hexaferrite thin film; easy axis; grain isolation; hard axis; intergranular magnetostatic interaction; low-power RF diode sputtering; magnetic properties; rapid thermal annealing; remanent magnetization; Diodes; Furnaces; Magnetic films; Magnetic properties; Magnetic separation; Magnetostatics; Radio frequency; Rapid thermal annealing; Sputtering; Temperature;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.508396

Filename

508396