• DocumentCode
    1084921
  • Title

    Creator: new advanced concepts in concurrent simulation

  • Author

    Gai, Silvano ; Montessoro, Pier Luca

  • Author_Institution
    Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
  • Volume
    13
  • Issue
    6
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    786
  • Lastpage
    795
  • Abstract
    Creator is a concurrent simulator for design verification and fault simulation of large circuits that highly integrates several traditional and innovative techniques. This is achieved by the introduction of a minimal information concept. Traditional techniques derived from previous works are Multiple List Traversal (MLT), trigger inhibition, fraternal event processing, list events, acid clock suppression, whereas the new ideas are function lists and evaluation functions, persistence time, positioning algorithm, evaluation triggering algorithm, combination of Single List Traversal (SLT) and MLT, and the implementation of transport delay in fault simulation. Generally the concurrent algorithm increases in complexity and the implementations grow in size and lose in performance as soon as higher abstraction levels are added beyond the gate one. To overcome this limitation, all the Creator´s techniques are not related to a specific abstraction level and lead to an intrinsic multilevel concurrent fault simulator. Experimental results are reported to compare Creator with our previous simulator and the state-of-the-art commercial simulator Verifault-XL on several platforms
  • Keywords
    VLSI; circuit analysis computing; digital integrated circuits; digital simulation; fault location; logic CAD; logic testing; parallel algorithms; Creator; concurrent simulation; design verification; evaluation functions; evaluation triggering algorithm; fault simulation; function lists; large circuits; multilevel concurrent fault simulator; multiple list traversal; persistence time; positioning algorithm; single list traversal; transport delay; Asynchronous circuits; Circuit faults; Circuit simulation; Clocks; Delay effects; Discrete event simulation; Terrorism; Timing; Very large scale integration; Writing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.285237
  • Filename
    285237