• DocumentCode
    1084944
  • Title

    A sense and restore technique for multilevel DRAM

  • Author

    Gillingham, Peter

  • Author_Institution
    Mosaid Technol. Incorp., Kanata, Ont., Canada
  • Volume
    43
  • Issue
    7
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    483
  • Lastpage
    486
  • Abstract
    A technique for storing and retrieving 2 b of data encoded as 4 voltage levels in a single DRAM memory cell is described. The 4 data levels and sense amplifier reference levels are created through simple charge redistribution techniques on local bitlines. Memory cells, sense amplifiers, and wordline drivers identical to standard DRAM are employed. A SPICE simulation using a representative 16 M DRAM process model shows correct sense and restore operation, with accurate generation of reference levels. The capacity of DRAM chips can be doubled with the addition of multilevel support circuitry that occupies less than 20% of die area
  • Keywords
    DRAM chips; SPICE; cellular arrays; circuit analysis computing; multivalued logic; 16 Mbit; SPICE simulation; charge redistribution techniques; die area; local bitlines; memory cells; multilevel DRAM; restore technique; sense amplifier; sense technique; voltage levels; wordline drivers; Capacitance; Circuit noise; Circuit simulation; Driver circuits; Information retrieval; Random access memory; Robustness; SPICE; Voltage; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.508424
  • Filename
    508424