DocumentCode
1085111
Title
Numerical Study of Gold Wire Bonding Process on Cu/Low-k Structures
Author
Viswanath, Akella G K ; Zhang, Xiaowu ; Ganesh, V.P. ; Chun, Lu
Author_Institution
Inst. of High Performance Comput., Singapore
Volume
30
Issue
3
fYear
2007
Firstpage
448
Lastpage
456
Abstract
A 2D transient nonlinear finite-element (FE) analysis of thermo sonic wire bonding process on Al-capped Cu/low-k structure is carried out to understand the deformations of bond pad and the responses of structure under bond pad. An FE methodology is established that includes the ultrasonic vibration of the capillary and the analysis is studied at the impacting stage of the wire bonding process. The FE framework allowed for the detailed study of stress evolution in the Cu/low-k structure during the process in order to elucidate the evolved stresses due to the deformation behavior of the bond pad. A comparative study between bonding process on Al-capped and Au-capped low-k structures is also conducted. Effect of variation of frictional coefficients, low-k and undoped silicon glass (USG) modulus and bond pad thickness, on low-k layers and bond pad are investigated to observe their mechanical responses. The effect of implementation of porous low-k material is also highlighted and its presence is shown to increase the sinking of bond pad by a considerable amount. Analysis of the FE calculations together with experimental results suggested some optimal parameters for the bonding process.
Keywords
aluminium; copper; deformation; dielectric materials; finite element analysis; gold; lead bonding; porous materials; silicon; thickness measurement; Al - Element; Au - Element; Cu - Element; Si - Element; bond pad deformation; bond pad thickness; frictional coefficient; gold wire bonding; numerical study; porous low-k material; stress evolution; thermo sonic wire bonding process; transient nonlinear finite-element analysis; ultrasonic vibration; undoped silicon glass; Bonding processes; Finite element methods; Glass; Gold; Iron; Silicon; Stress; Transient analysis; Vibrations; Wire; Cu/low-k; nonlinear analysis; porous-low-k; wirebond;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2006.890213
Filename
4285952
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