• DocumentCode
    1085111
  • Title

    Numerical Study of Gold Wire Bonding Process on Cu/Low-k Structures

  • Author

    Viswanath, Akella G K ; Zhang, Xiaowu ; Ganesh, V.P. ; Chun, Lu

  • Author_Institution
    Inst. of High Performance Comput., Singapore
  • Volume
    30
  • Issue
    3
  • fYear
    2007
  • Firstpage
    448
  • Lastpage
    456
  • Abstract
    A 2D transient nonlinear finite-element (FE) analysis of thermo sonic wire bonding process on Al-capped Cu/low-k structure is carried out to understand the deformations of bond pad and the responses of structure under bond pad. An FE methodology is established that includes the ultrasonic vibration of the capillary and the analysis is studied at the impacting stage of the wire bonding process. The FE framework allowed for the detailed study of stress evolution in the Cu/low-k structure during the process in order to elucidate the evolved stresses due to the deformation behavior of the bond pad. A comparative study between bonding process on Al-capped and Au-capped low-k structures is also conducted. Effect of variation of frictional coefficients, low-k and undoped silicon glass (USG) modulus and bond pad thickness, on low-k layers and bond pad are investigated to observe their mechanical responses. The effect of implementation of porous low-k material is also highlighted and its presence is shown to increase the sinking of bond pad by a considerable amount. Analysis of the FE calculations together with experimental results suggested some optimal parameters for the bonding process.
  • Keywords
    aluminium; copper; deformation; dielectric materials; finite element analysis; gold; lead bonding; porous materials; silicon; thickness measurement; Al - Element; Au - Element; Cu - Element; Si - Element; bond pad deformation; bond pad thickness; frictional coefficient; gold wire bonding; numerical study; porous low-k material; stress evolution; thermo sonic wire bonding process; transient nonlinear finite-element analysis; ultrasonic vibration; undoped silicon glass; Bonding processes; Finite element methods; Glass; Gold; Iron; Silicon; Stress; Transient analysis; Vibrations; Wire; Cu/low-k; nonlinear analysis; porous-low-k; wirebond;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2006.890213
  • Filename
    4285952