• DocumentCode
    1085421
  • Title

    Reliable SR latches design using local redundancy

  • Author

    Lin, S.H. ; Yang, H.Z.

  • Author_Institution
    Dept. of Electron. Eng., Tsinghua Univ., Beijing
  • Volume
    43
  • Issue
    2
  • fYear
    2007
  • Firstpage
    82
  • Lastpage
    84
  • Abstract
    By using local redundancy, two improved soft-error-tolerant SR latches are proposed. Experimental results show that the new latches have superior delay performance compared to the traditional ones and can recover from the soft errors caused by cosmic rays and particle strikes
  • Keywords
    flip-flops; radiation hardening (electronics); SR latches; local redundancy; soft-error-tolerant;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20073262
  • Filename
    4084097
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1085421