• DocumentCode
    1085530
  • Title

    Statistical analysis of power module thermal test equipment performance

  • Author

    Houf, Robert E. ; Berman, David B.

  • Author_Institution
    Allen-Bradley Co. Inc., Milwaukee, WI, USA
  • Volume
    11
  • Issue
    4
  • fYear
    1988
  • Firstpage
    516
  • Lastpage
    520
  • Abstract
    Describe a test methodology for obtaining reliable thermal performance measurements for custom design of moderately-high-power semiconductor modules. The accuracy and repeatability of the instrument system was determined by use of a statistical gauge study. It is shown that the statistical tool is essential in determining the ability of the measurement system to detect and quantify variability in the data due to the parts under test, the test equipment, and operator influences. The proposed method provides a means of demonstrating vendor/supplier test capability which can reduce potential sources of conflict in part acceptance testing.<>
  • Keywords
    modules; power integrated circuits; statistical analysis; test equipment; conflict; custom design; operator influences; part acceptance testing; parts under test; power module thermal test equipment performance; semiconductor modules; statistical gauge study; test capability; variability; Electrical resistance measurement; Electronic packaging thermal management; Heat sinks; Multichip modules; Resistance heating; Statistical analysis; Test equipment; Testing; Thermal resistance; Thyristors;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.16692
  • Filename
    16692