• DocumentCode
    1087174
  • Title

    Subwavelength Nanopatch Cavities for Semiconductor Plasmon Lasers

  • Author

    Manolatou, Christina ; Rana, Farhan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY
  • Volume
    44
  • Issue
    5
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    435
  • Lastpage
    447
  • Abstract
    We propose and analyze a family of nanoscale cavities for electrically pumped surface-emitting semiconductor lasers that use surface plasmons to provide optical mode confinement in cavities which have dimensions in the 100-300-nm range. The proposed laser cavities are in many ways nanoscale optical versions of micropatch antennas that are commonly used at microwave/RF frequencies. Surface plasmons are not only used for mode confinement but also for output beam shaping to realize single-lobe far-field radiation patterns with narrow beam waists from subwavelength size cavities. We identify the cavity modes with the largest quality factors and modal gain, and show that in the near-IR wavelength range (1.0-1.6 mum) cavity losses (including surface plasmon losses) can be compensated by the strong mode confinement in the gain region provided by the surface plasmons themselves and the required material threshold gain values can be smaller than 700 cm-1.
  • Keywords
    nanotechnology; semiconductor lasers; surface emitting lasers; surface plasmons; cavity losses; electrically pumped surface-emitting semiconductor lasers; integrated optoelectronics; laser cavity; optical mode confinement; semiconductor plasmon lasers; size 100 nm to 300 nm; strong mode confinement; subwavelength nanopatch cavity; surface plasmons; wavelength 1.0 mum to 1.6 mum; Laser beams; Laser modes; Masers; Optical pumping; Optical surface waves; Plasmons; Pump lasers; Semiconductor lasers; Surface emitting lasers; Surface waves; Integrated optoelectronics; nanotechnology; plasmons; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2008.916707
  • Filename
    4459780