• DocumentCode
    1089883
  • Title

    An inductively coupled single-flux quantum NDRO memory cell

  • Author

    Kojima, K. ; Noguchi, T. ; Hamanaka, K.

  • Author_Institution
    Electric Corp., Amagasaki, Hyogo, Japan
  • Volume
    4
  • Issue
    8
  • fYear
    1983
  • fDate
    8/1/1983 12:00:00 AM
  • Firstpage
    264
  • Lastpage
    266
  • Abstract
    An inductively coupled single-flux quantum nondestructive readout (NDRO) memory cell was fabricated. Control lines of this memory cell are coupled to the main inductance loop. The margin for the damping resistor becomes larger than for a multiflux quantum memory cell. The memory cell containing all return lines occupies only 247 minimum-linewidth squares, on the basis of a 5-µm rule Pb-alloy technique.
  • Keywords
    Damping; Energy storage; Fabrication; Inductance; Josephson junctions; Nonvolatile memory; Power dissipation; Process control; Resistors; Writing;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25727
  • Filename
    1483471