DocumentCode
1089883
Title
An inductively coupled single-flux quantum NDRO memory cell
Author
Kojima, K. ; Noguchi, T. ; Hamanaka, K.
Author_Institution
Electric Corp., Amagasaki, Hyogo, Japan
Volume
4
Issue
8
fYear
1983
fDate
8/1/1983 12:00:00 AM
Firstpage
264
Lastpage
266
Abstract
An inductively coupled single-flux quantum nondestructive readout (NDRO) memory cell was fabricated. Control lines of this memory cell are coupled to the main inductance loop. The margin for the damping resistor becomes larger than for a multiflux quantum memory cell. The memory cell containing all return lines occupies only 247 minimum-linewidth squares, on the basis of a 5-µm rule Pb-alloy technique.
Keywords
Damping; Energy storage; Fabrication; Inductance; Josephson junctions; Nonvolatile memory; Power dissipation; Process control; Resistors; Writing;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1983.25727
Filename
1483471
Link To Document