• DocumentCode
    1089907
  • Title

    Surface Raman ellipsometry

  • Author

    Eesley, Gary L.

  • Author_Institution
    DepElectro-optical Engineering Division,Hughes Aircraft Company,Culver City,CA
  • Volume
    17
  • Issue
    7
  • fYear
    1981
  • fDate
    7/1/1981 12:00:00 AM
  • Firstpage
    1285
  • Lastpage
    1292
  • Abstract
    A method for achieving the ultrahigh sensitivity required for surface vibrational spectroscopy is proposed. Polarization selective heterodyne detection permits shot-noise limited submonolayer detection with classically noisy picosecond laser sources. Furthermore, the polarization selectivity is used to eliminate the overwhelming thermally induced changes in surface reflecfivity.
  • Keywords
    Raman spectroscopy; Surfaces; Ellipsometry; Polarization; Probes; Pump lasers; Raman scattering; Reflectivity; Rough surfaces; Spectroscopy; Stimulated emission; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1981.1071264
  • Filename
    1071264