• DocumentCode
    1089915
  • Title

    Stacked CMOS SRAM cell

  • Author

    Chen, C.E. ; Lam, H.W. ; Malhi, S.D.S. ; Pinizzotto, R.F.

  • Author_Institution
    Texas Instruments, Inc., Dallas, TX
  • Volume
    4
  • Issue
    8
  • fYear
    1983
  • fDate
    8/1/1983 12:00:00 AM
  • Firstpage
    272
  • Lastpage
    274
  • Abstract
    A static random access memory (SRAM) cell with cross-coupled stacked CMOS inverters is demonstrated for the first time. In this approach, CMOS inverters are fabricated with a laser recrystallized p-channel device stacked on top of and sharing the gate with a bulk n-channel device using a modified two-polysilicon n-MOS process. The memory cell has been exercised through the write and read cycles with external signal generators while the output is buffered by an on-chip, stacked-CMOS-inverter-based amplifier.
  • Keywords
    Circuit testing; Coatings; Etching; Laser modes; MOS devices; Power lasers; Random access memory; Silicon; Thermal stresses; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1983.25730
  • Filename
    1483474