DocumentCode
1091549
Title
Measurement and analysis of periodic coupling in silicon-clad planar waveguides
Author
McWright, G. ; Batchman, T.E. ; Stanziano, M.S.
Author_Institution
Univ. of Virginia, Charlottesville, VA, USA
Volume
18
Issue
10
fYear
1982
fDate
10/1/1982 12:00:00 AM
Firstpage
1765
Lastpage
1771
Abstract
Computer modeling studies indicate that planar dielectric waveguides clad with silicon exhibit a damped periodic oscillation in their attenuation and phase characteristics. The effect is due to a periodic coupling between the lossy, guided modes in the silicon film and the TE0 mode of the dielectric waveguide. Experimental confirmation of the periodic coupling for a wavelength of 632.8 nm is presented. Propagation characteristics for a wavelength of 1150 nm were investigated for application in integrated optical modulators. Frequency filtering properties of silicon-clad waveguides are also examined and it is shown that the silicon thickness controls the filter response curve.
Keywords
Optical planar waveguide couplers; Semiconductor films; Semiconductor-loaded waveguides; Silicon materials/devices; Attenuation; Dielectric losses; Dielectric measurements; Optical films; Optical filters; Optical losses; Optical modulation; Optical waveguides; Planar waveguides; Silicon;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1982.1071421
Filename
1071421
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