• DocumentCode
    1091549
  • Title

    Measurement and analysis of periodic coupling in silicon-clad planar waveguides

  • Author

    McWright, G. ; Batchman, T.E. ; Stanziano, M.S.

  • Author_Institution
    Univ. of Virginia, Charlottesville, VA, USA
  • Volume
    18
  • Issue
    10
  • fYear
    1982
  • fDate
    10/1/1982 12:00:00 AM
  • Firstpage
    1765
  • Lastpage
    1771
  • Abstract
    Computer modeling studies indicate that planar dielectric waveguides clad with silicon exhibit a damped periodic oscillation in their attenuation and phase characteristics. The effect is due to a periodic coupling between the lossy, guided modes in the silicon film and the TE0mode of the dielectric waveguide. Experimental confirmation of the periodic coupling for a wavelength of 632.8 nm is presented. Propagation characteristics for a wavelength of 1150 nm were investigated for application in integrated optical modulators. Frequency filtering properties of silicon-clad waveguides are also examined and it is shown that the silicon thickness controls the filter response curve.
  • Keywords
    Optical planar waveguide couplers; Semiconductor films; Semiconductor-loaded waveguides; Silicon materials/devices; Attenuation; Dielectric losses; Dielectric measurements; Optical films; Optical filters; Optical losses; Optical modulation; Optical waveguides; Planar waveguides; Silicon;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1982.1071421
  • Filename
    1071421