• DocumentCode
    1093377
  • Title

    An algorithm for successive identification of reflections

  • Author

    Hansen, Kim V. ; Larsen, Jan

  • Author_Institution
    Odegaard & Danneskiold-Samsoe ApS, Copenhagen, Denmark
  • Volume
    3
  • Issue
    3
  • fYear
    1994
  • fDate
    5/1/1994 12:00:00 AM
  • Firstpage
    281
  • Lastpage
    291
  • Abstract
    A new algorithm for successive identification of seismic reflections is proposed. Generally, the algorithm can be viewed as a curve matching method for images with specific structure. However, in the paper, the algorithm works on seismic signals assembled to constitute an image in which the investigated reflections produce curves. In numerical examples, the authors work on signals assembled in CMP gathers. The key idea of the algorithm is to estimate the reflection curve parameters and the reflection coefficients along these curves by combining the multipulse technique and the generalized Radon transform. The multipulse technique is used for wavelet identification in each trace, and the generalized Radon transform is used to coordinate the wavelet identification between the individual traces. Furthermore, a stop criterion and a reflection validation procedure are presented. The stop criterion stops the reflection estimation when the actual estimated reflection is insignificant. The reflection validation procedure ensures that the estimated reflections follow the shape of the investigated reflection curves. The algorithm is successfully used in two numerical examples. One is based on a synthetic CMP gather, whereas the other is based on a real recorded CMP gather. Initially, the algorithm requires an estimate of the wavelet that can be performed by any wavelet estimation method
  • Keywords
    geophysical techniques; image processing; parameter estimation; reflection; seismology; wavelet transforms; CMP gathers; algorithm; curve matching method; generalized Radon transform; images; multipulse technique; numerical examples; reflection coefficients; reflection curve parameters; reflection validation procedure; reflections; seismic reflections; seismic signals; stop criterion; successive identification; wavelet identification; Assembly; Computer networks; Geology; Geometry; Helium; Neural networks; Reflection; Shape; Sonar equipment; Wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/83.287021
  • Filename
    287021