• DocumentCode
    1093460
  • Title

    Multi-element reachthrough avalanche photodiodes

  • Author

    Webb, Paul P. ; Mcintyre, Robert J.

  • Author_Institution
    RCA, Inc., Quebec, Canada
  • Volume
    31
  • Issue
    9
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    1206
  • Lastpage
    1212
  • Abstract
    Two approaches to making multi-element arrays of p+-π-p-n+reachthrough avalanche photodiodes are reported. In the first approach a single common avalanche region (p-layer) for all elements is used, with the segmentation between elements being on the p+layer. This approach has the advantage of having zero dead space between adjacent elements, but is difficult to fabricate, and has a very narrow range of operation in which it is neither noisy due to injection nor suffers from poor element-to-element isolation. In a second approach, the p+contact is common and separate avalanche regions are used. The problem for this case is the width of the dead space between adjacent elements which, because of field-fringing effects, is considerably wider than the actual physical distance between elements. A self-aligning technique is described for fabricating arrays by the second approach and the technique demonstrated with a 25-element linear array on 300-µm centers. The measured dead space is in the 60-80 µm range, depending on the gain. The array can be used at an average gain of 100 or more, has excellent element-to-element isolation, and NEP´s below 2 × 1015W/Hz1/2at 800-900 nm and below 10-14W/ Hz1/2over the whole spectral range from 400 to 1060 nm.
  • Keywords
    Avalanche photodiodes; Charge carrier processes; Fabrication; Frequency response; Gain measurement; Helium; Ionization; Ionizing radiation; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21689
  • Filename
    1483974