• DocumentCode
    1093947
  • Title

    Thermal comparison of long-wavelength vertical-cavity surface-emitting laser diodes

  • Author

    Piprek, Joachim ; Yoo, S.J.B.

  • Author_Institution
    Mater. Sci. Programme, Delaware Univ., Newark, DE
  • Volume
    30
  • Issue
    11
  • fYear
    1994
  • fDate
    5/26/1994 12:00:00 AM
  • Firstpage
    866
  • Lastpage
    868
  • Abstract
    Heat flow finite element analysis is applied to basic device concepts, including planar structures with InGaAsP/InP or AlAs/GaAs substrate side mirrors (mounted top-up or top-down) and etched-well lasers with Si/SiO2 dielectric mirrors. In several cases, the calculated thermal resistance values are higher than with short-wavelength devices, but wafer-fused structures on GaAs substrate show clear thermal advantages
  • Keywords
    finite element analysis; laser accessories; laser cavity resonators; mirrors; semiconductor lasers; thermal resistance; AlAs-GaAs; AlAs/GaAs substrate side mirrors; InGaAsP-InP; InGaAsP/InP substrate side mirrors; Si-SiO2; Si/SiO2 dielectric mirrors; etched-well lasers; heat flow finite element analysis; long-wavelength vertical-cavity surface-emitting laser diodes; planar structures; thermal resistance; wafer-fused structures;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19940589
  • Filename
    287469
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1093947