DocumentCode
1094598
Title
An interline CCD image sensor with reduced image lag
Author
Teranishi, N. ; Kohno, Akiyoshi ; Ishihara, Yasuo ; Oda, Eiji ; Arai, Kenta
Author_Institution
NEC Corporation, Miyazaki, Miyamea-ku, Kawasaki, Japan
Volume
31
Issue
12
fYear
1984
fDate
12/1/1984 12:00:00 AM
Firstpage
1829
Lastpage
1833
Abstract
An undesirable image lag with a long time constant was found in the interline CCD image sensor having an n+-p-junction photodiode (PD). This paper clarifies the image lag mechanism and proposes a new photodiode structure having very little image lag. The image lag measurement method and the experimental results are also given. The experimental results quantitatively agree with the analytical model, in which signal electrons are assumed to be transferred from the PD to the vertical CCD as a small subthreshold current. To eliminate the image lag, a p+-n-p-structure PD with low donor concentration is proposed, in which all the signal electrons can be quickly transferred before the subthreshold condition begins. As a result, decay lag values for the first and the second fields were reduced to half and no decay lags were observed after the third field.
Keywords
Ambient intelligence; Analytical models; Charge coupled devices; Charge-coupled image sensors; Electrons; Image sensors; Lamps; Lighting; Photodiodes; Solid state circuits;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21796
Filename
1484081
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