• DocumentCode
    1094598
  • Title

    An interline CCD image sensor with reduced image lag

  • Author

    Teranishi, N. ; Kohno, Akiyoshi ; Ishihara, Yasuo ; Oda, Eiji ; Arai, Kenta

  • Author_Institution
    NEC Corporation, Miyazaki, Miyamea-ku, Kawasaki, Japan
  • Volume
    31
  • Issue
    12
  • fYear
    1984
  • fDate
    12/1/1984 12:00:00 AM
  • Firstpage
    1829
  • Lastpage
    1833
  • Abstract
    An undesirable image lag with a long time constant was found in the interline CCD image sensor having an n+-p-junction photodiode (PD). This paper clarifies the image lag mechanism and proposes a new photodiode structure having very little image lag. The image lag measurement method and the experimental results are also given. The experimental results quantitatively agree with the analytical model, in which signal electrons are assumed to be transferred from the PD to the vertical CCD as a small subthreshold current. To eliminate the image lag, a p+-n-p-structure PD with low donor concentration is proposed, in which all the signal electrons can be quickly transferred before the subthreshold condition begins. As a result, decay lag values for the first and the second fields were reduced to half and no decay lags were observed after the third field.
  • Keywords
    Ambient intelligence; Analytical models; Charge coupled devices; Charge-coupled image sensors; Electrons; Image sensors; Lamps; Lighting; Photodiodes; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21796
  • Filename
    1484081