DocumentCode
1094788
Title
Proton-implanted stripe-geometry (Al, Ga)As lasers using SiO2 masking
Author
Koszi, L.A. ; Donnelly, V.M. ; Dautremont-Smith, W.C. ; Barnes, P.A.
Author_Institution
AT&T Bell Laboratories, Murray Hill, NJ
Volume
31
Issue
12
fYear
1984
fDate
12/1/1984 12:00:00 AM
Firstpage
1910
Lastpage
1912
Abstract
Proton-bombarded gain-guided stripe-geometry (Al, Ga)As lasers have been made using an SiO2 proton-implant mask. The Plasma-deposited SiO2 was anisotropically plasma etched to yield vertical-walled stripes which acted as the high-resolution implant mask, Stripe width is determined solely by photolithography, and consequently strict tolerances can be maintained for optimum laser performance yields. A typical SiO2 proton mask was 2.5 µm thick and 4.5 µm wide. The electrical and optical characteristics and accelerated aging behavior of these lasers are identical to those of lasers originating from neighboring wafer sites which were wire masked. The use of an anisotropically etched dielectric mask has many advantages over wire or plated metal implant masks, making it ideally suited for use on large wafers.
Keywords
Accelerated aging; Anisotropic magnetoresistance; Dielectrics; Etching; Geometrical optics; Implants; Lithography; Plasma applications; Protons; Wire;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1984.21812
Filename
1484097
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