• DocumentCode
    1094788
  • Title

    Proton-implanted stripe-geometry (Al, Ga)As lasers using SiO2masking

  • Author

    Koszi, L.A. ; Donnelly, V.M. ; Dautremont-Smith, W.C. ; Barnes, P.A.

  • Author_Institution
    AT&T Bell Laboratories, Murray Hill, NJ
  • Volume
    31
  • Issue
    12
  • fYear
    1984
  • fDate
    12/1/1984 12:00:00 AM
  • Firstpage
    1910
  • Lastpage
    1912
  • Abstract
    Proton-bombarded gain-guided stripe-geometry (Al, Ga)As lasers have been made using an SiO2proton-implant mask. The Plasma-deposited SiO2was anisotropically plasma etched to yield vertical-walled stripes which acted as the high-resolution implant mask, Stripe width is determined solely by photolithography, and consequently strict tolerances can be maintained for optimum laser performance yields. A typical SiO2proton mask was 2.5 µm thick and 4.5 µm wide. The electrical and optical characteristics and accelerated aging behavior of these lasers are identical to those of lasers originating from neighboring wafer sites which were wire masked. The use of an anisotropically etched dielectric mask has many advantages over wire or plated metal implant masks, making it ideally suited for use on large wafers.
  • Keywords
    Accelerated aging; Anisotropic magnetoresistance; Dielectrics; Etching; Geometrical optics; Implants; Lithography; Plasma applications; Protons; Wire;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1984.21812
  • Filename
    1484097