• DocumentCode
    1095276
  • Title

    Concurrent error detection and fault location in an FFT architecture

  • Author

    Lombardi, Fabrizio ; Muzio, Jon C.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • Volume
    27
  • Issue
    5
  • fYear
    1992
  • fDate
    5/1/1992 12:00:00 AM
  • Firstpage
    728
  • Lastpage
    736
  • Abstract
    A new approach for concurrent error detection in a homogeneous architecture for the computation of the complex N-point fast Fourier transform (FFT) in radix-2 is presented. The proposed approach is based on the relationship between cell computations. It is proved that 100% probability of detection is possible. Overhead issues for hardware and timing are addressed. It is proved that hardware overhead for concurrent error detection is 50% compared to a fault-intolerant complex two-point implementation. A modest time overhead is encountered for error detection and fault location. Error detection can be accommodated online and on a component basis (multiplier or adder/subtractor): full fault location is accomplished by a roving technique. The proposed technique can be efficiently accommodated in a homogeneous layout. A two-phase reconfiguration policy for the proposed architecture is presented. It is proved that switching and routing overhead is modest, while reliability is significantly improved over previous approaches
  • Keywords
    computerised signal processing; error detection; fast Fourier transforms; fault location; fault tolerant computing; parallel architectures; redundancy; DSP; FFT architecture; concurrent error detection; fast Fourier transform; fault location; hardware overhead; homogeneous architecture; reliability; roving technique; two-phase reconfiguration policy; Computer aided manufacturing; Computer architecture; Digital signal processing; Fast Fourier transforms; Fault detection; Fault location; Fault tolerance; Hardware; Roundoff errors; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.133159
  • Filename
    133159