• DocumentCode
    1096259
  • Title

    Static random access memory using high electron mobility transistors

  • Author

    Lee, S.J. ; Lee, C.P. ; Hou, D.L. ; Anderson, R.J. ; Miller, D.L.

  • Author_Institution
    Rockwell International, Thousanda Oaks, CA
  • Volume
    5
  • Issue
    4
  • fYear
    1984
  • fDate
    4/1/1984 12:00:00 AM
  • Firstpage
    115
  • Lastpage
    117
  • Abstract
    A 4-bit fully decoded static random access memory (RAM) has been designed and fabricated using high electron mobility transistors (HEMT´s) with a direct-coupled FET logic approach. The circuit incorporates approximately 50 logic gates. A fully operating memory circuit was demonstrated with an access time of 1.1 ns and a minimum WRITE-enable pulse of less than 2-ns duration at room temperature. This memory consumes a total power of 14.89 mW and 87.8 µW per memory cell.
  • Keywords
    Decoding; FETs; HEMTs; Logic circuits; Logic design; Logic gates; MODFETs; Random access memory; Read-write memory; SRAM chips;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25852
  • Filename
    1484228