DocumentCode
1096259
Title
Static random access memory using high electron mobility transistors
Author
Lee, S.J. ; Lee, C.P. ; Hou, D.L. ; Anderson, R.J. ; Miller, D.L.
Author_Institution
Rockwell International, Thousanda Oaks, CA
Volume
5
Issue
4
fYear
1984
fDate
4/1/1984 12:00:00 AM
Firstpage
115
Lastpage
117
Abstract
A 4-bit fully decoded static random access memory (RAM) has been designed and fabricated using high electron mobility transistors (HEMT´s) with a direct-coupled FET logic approach. The circuit incorporates approximately 50 logic gates. A fully operating memory circuit was demonstrated with an access time of 1.1 ns and a minimum WRITE-enable pulse of less than 2-ns duration at room temperature. This memory consumes a total power of 14.89 mW and 87.8 µW per memory cell.
Keywords
Decoding; FETs; HEMTs; Logic circuits; Logic design; Logic gates; MODFETs; Random access memory; Read-write memory; SRAM chips;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1984.25852
Filename
1484228
Link To Document