• DocumentCode
    1096272
  • Title

    Characteristics of Pure-shear Mode BAW Resonators Consisting of (1120) Textured ZnO Films

  • Author

    Yanagitani, Takahiko ; Kiuchi, Masato ; Matsukawa, Mami ; Watanabe, Yoshiaki

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol., Ikeda
  • Volume
    54
  • Issue
    8
  • fYear
    2007
  • fDate
    8/1/2007 12:00:00 AM
  • Firstpage
    1680
  • Lastpage
    1686
  • Abstract
    Thickness pure-shear mode film bulk acoustic wave resonators (PBARs) made of (112 macr0) textured ZnO films have been fabricated. We also have fabricated FBAR structure consisting of two layers of the (112 macr0) textured ZnO film with opposite polarization directions. This FBAR structure operated in second overtone pure-shear mode and allowed shear-mode FBARs at higher frequency. The effective electromechanical coupling coefficients keff 2 of pure- shear mode FBAR and second overtone pure-shear mode FBAR in this study were found to be 3.3% and 0.8%, respectively. The temperature coefficient of frequency (TCF) of thickness extensional mode FBAR, pure-shear mode FBAR, and second overtone pure-shear mode FBAR were measured in the temperature range of 10-60degC. TCF values of -63.1 ppm/degC, -34.7 ppm/degC, and -35.6 ppm/degC were found for the thickness extensional mode FBAR, the pure- shear mode FBAR, and the second overtone pure-shear mode FBAR, respectively. These results demonstrated that pure-shear mode ZnO FBARs have more stable temperature characteristics than the conventional thickness extensional mode ZnO FBARs.
  • Keywords
    II-VI semiconductors; acoustic resonators; bulk acoustic wave devices; wide band gap semiconductors; zinc compounds; ZnO; ZnO - Binary; electromechanical coupling coefficients; film bulk acoustic wave resonators; pure-shear mode BAW resonators; temperature 10 degC to 60 degC; temperature coefficient of frequency; textured ZnO films; Acoustic waves; Crystallization; Electrodes; Film bulk acoustic resonators; Frequency; Piezoelectric films; Substrates; Temperature sensors; Thermal expansion; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2007.439
  • Filename
    4291518