• DocumentCode
    1096863
  • Title

    A method for extracting SPICE2 junction capacitance parameters from measured data

  • Author

    Freese, B.A. ; Buller, G.L.

  • Author_Institution
    Storage Technology Corporation, Louisville, CO
  • Volume
    5
  • Issue
    7
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    261
  • Lastpage
    262
  • Abstract
    This paper describes a method for extracting SPICE2 junction capacitance parameters from measured data. The method is efficient and accurate, and is easily integrated into an automatic test and data analysis system.
  • Keywords
    Capacitance measurement; Capacitors; Data mining; Equations; Integrated circuit modeling; Jacobian matrices; Parameter extraction; Parasitic capacitance; System testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25911
  • Filename
    1484287
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1096863