DocumentCode
1098020
Title
Reply to "Comments on \´source-and-drain series resistance of LDD MOSFET\´s\´"
Author
Sheu, B.J. ; Hu, C. ; Ko, P.K. ; Hsu, F.-C.
Author_Institution
University of California, Berkeley, CA
Volume
5
Issue
12
fYear
1984
Firstpage
535
Lastpage
535
Keywords
Electric resistance; Electrical resistance measurement; Error correction; Intrusion detection; Labeling; Laboratories; Length measurement; MOSFET circuits; Monitoring; Physics;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1984.26016
Filename
1484392
Link To Document