Dopant-Segregated Schottky Silicon-Nanowire MOSFETs With Gate-All-Around Channels

In this letter, we demonstrated dopant-segregated Schottky (DSS) p-MOSFET with gate-all-around silicon-nanowire (SiNW) channel of 10 nm in diameter. The DSS transistor shows improved performance as compared to a reference Schottky barrier (SB) transistor without dopant segregation. The DSS transistor shows I _ON of 319 muA/mum at a low gate overdrive of -0.6 V, high I _ON/I _OFF ratio (~10⁵), and short-channel performance with subthreshold slope ~90 mV/dec down to 100-nm gate length with relatively thick (6 nm) deposited gate oxide. The DSS transistor also shows significant reduction (~40times lower) in the series resistance as compared to the SB transistor. The origin of the improved performance of the DSS is the thin dopant layer segregated at the nickel monosilicide/SiNW point contact which results in the enhanced hole injection at the source side and the suppressed electron injection at the drain side.