• DocumentCode
    1100015
  • Title

    The microwave surface impedance of high-Tc superconductors

  • Author

    Piel, H. ; Müller, G.

  • Author_Institution
    Fachbereich Phys., Bergischen Univ., Wuppertal, Germany
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    854
  • Lastpage
    862
  • Abstract
    The available data on the microwave surface impedance Zs of high-Tc superconductors from more than 30 laboratories around the world are reviewed to show the frequency, temperature, and field dependence of the surface resistance Rs and the temperature dependence of the field penetration depth λ. The data are discussed on the basis of a two-fluid model and are compared with results from the classical superconductors Nb and Nb3Sn. At temperatures above 0.8 Tc, Zs values of classical and high-Tc superconductors show strong similarities and are in close agreement with the Mattis-Bardeen theory. The comparatively very high Rs of the cuprates at 4.2 K, however, is indicative of a high density of unpaired charge carriers. The lowest values for Rs and λ obtained until now with epitaxially grown YBa2Cu3O7-δ films are 16 μΩ at 4.2 K and 10 GHz and 140 nm, respectively. Such films are required for high RF field applications. Polycrystalline samples show a strong field dependence of Rs. The highest magnetic surface field without Rs deterioration achieved so far on single crystals of YBa2Cu3O7-δ is about 100 G
  • Keywords
    barium compounds; electromagnetic wave absorption; high-temperature superconductors; reviews; superconducting thin films; yttrium compounds; field dependence; frequency; high temperature superconductor; microwave surface impedance; temperature dependence; two-fluid model; unpaired charge carriers; Charge carriers; Frequency; Laboratories; Magnetic films; Niobium; Superconductivity; Surface impedance; Surface resistance; Temperature dependence; Tin;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133310
  • Filename
    133310