• DocumentCode
    1100399
  • Title

    A GaAs 1-kbit static RAM with a shallow recessed-gate structure FET

  • Author

    Takano, Satoshi ; Tanino, Noriyuki ; Yoshihara, Tsutomu ; Mitsui, Yasuo ; Nishitani, Kazuo

  • Author_Institution
    Mitsubishi Electric Corporation, Hyogo, Japan
  • Volume
    32
  • Issue
    6
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    1135
  • Lastpage
    1139
  • Abstract
    A novel GaAs FET structure, the shallow recessed-gate structure, has been proposed and applied to a 1-kbit static RAM. In order to decrease the source resistance Rsand gate capacitance Cg, the shallow n+implanted layer was formed between the gate and source/drain region; then the gate region was slightly recessed. This FET has a high transconductance gm, low source resistance Rs, small gate capacitance Cg, and small deviation of threshold voltage \\partial V_{th} , and thus is suitable for high-speed GaAs LSI\´s. A 1-kbit static RAM has been designed and fabricated applying this FET structure and an access time of 3.8 ns with 38- mW power dissipation has been obtained.
  • Keywords
    Circuits; Electrodes; FETs; Gallium arsenide; Large scale integration; Parasitic capacitance; Power dissipation; Read-write memory; Surface resistance; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22086
  • Filename
    1484832