DocumentCode
1100399
Title
A GaAs 1-kbit static RAM with a shallow recessed-gate structure FET
Author
Takano, Satoshi ; Tanino, Noriyuki ; Yoshihara, Tsutomu ; Mitsui, Yasuo ; Nishitani, Kazuo
Author_Institution
Mitsubishi Electric Corporation, Hyogo, Japan
Volume
32
Issue
6
fYear
1985
fDate
6/1/1985 12:00:00 AM
Firstpage
1135
Lastpage
1139
Abstract
A novel GaAs FET structure, the shallow recessed-gate structure, has been proposed and applied to a 1-kbit static RAM. In order to decrease the source resistance Rs and gate capacitance Cg , the shallow n+implanted layer was formed between the gate and source/drain region; then the gate region was slightly recessed. This FET has a high transconductance gm , low source resistance Rs , small gate capacitance Cg , and small deviation of threshold voltage
, and thus is suitable for high-speed GaAs LSI\´s. A 1-kbit static RAM has been designed and fabricated applying this FET structure and an access time of 3.8 ns with 38- mW power dissipation has been obtained.
, and thus is suitable for high-speed GaAs LSI\´s. A 1-kbit static RAM has been designed and fabricated applying this FET structure and an access time of 3.8 ns with 38- mW power dissipation has been obtained.Keywords
Circuits; Electrodes; FETs; Gallium arsenide; Large scale integration; Parasitic capacitance; Power dissipation; Read-write memory; Surface resistance; Threshold voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.22086
Filename
1484832
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