• DocumentCode
    1100757
  • Title

    The Hooge parameters for n- and p-type Hg1-xCdxTe

  • Author

    Zhu, Xi-chen ; Wu, Xiaolan ; Van Der, Ziel A. ; Kelso, E.G.

  • Author_Institution
    Kunming Institute of Physics, Kunming, Peoples Republic of China
  • Volume
    32
  • Issue
    7
  • fYear
    1985
  • fDate
    7/1/1985 12:00:00 AM
  • Firstpage
    1353
  • Lastpage
    1354
  • Abstract
    The values of the electron effective mass m_{e*} in Hg1-xCdxTe have been calculated for x = 0.20, 0.30, 0.40. Using the Debye temperature θDfor CdTe, the values of the Hooge parameter for Hg1-xCdxTe have been estimated as a function of x and the temperature T . In view of the uncertainty in θD, the estimate is probably correct within a factor of 2-3. We have also directly calculated θDfor Hg1-xCdxTe and its associated Hooge parameters as a function of x ; except for a possible temperature dependence of θD, the results should be correct near room temperature.
  • Keywords
    Density estimation robust algorithm; Effective mass; Electrons; Frequency; Mercury (metals); Resistors; Semiconductor device noise; Temperature dependence; Temperature distribution; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22123
  • Filename
    1484869