• DocumentCode
    1101839
  • Title

    Modeling the influence of the transistor gain ratio and the input-to-output coupling capacitance on the CMOS inverter delay

  • Author

    Jeppson, Kjell O.

  • Author_Institution
    Dept. of Solid State Electron., Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    29
  • Issue
    6
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    646
  • Lastpage
    654
  • Abstract
    An improved model for the ramp response of a CMOS inverter has been derived where the influences of the short-circuit current and the input-to-output coupling capacitance are considered. These effects modify the ideal linear relationship between the inverter propagation delay and the input ramp rise/fall time by adding a term proportional to the charge supplied by the short-circuiting transistor. This term is shown to contain first- and second-order contributions of the input ramp rise/fall time where the second-order contribution effectively models the propagation delay roll-off for slow input ramps. Both the first and the second-order effects are found to be affected by the P-to-N-channel gain ratio. The model shows excellent agreement with SPICE level 3 simulations; even when the short-circuiting transistor has a driving capability twice that of the charging/discharging transistor the error in the propagation delay is only about 2% for a slow input ramp (input-to-output slope-ratio at VDD/2 equal to 1:2)
  • Keywords
    CMOS integrated circuits; capacitance; delays; integrated logic circuits; logic gates; semiconductor device models; CMOS inverter delay; input ramp rise/fall time; input-to-output coupling capacitance; inverter propagation delay; model; ramp response; short-circuit current; transistor gain ratio; CMOS logic circuits; Capacitance; Circuit simulation; Delay effects; Design optimization; Inverters; Propagation delay; SPICE; Semiconductor device modeling; Transistors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.293109
  • Filename
    293109