• DocumentCode
    1103385
  • Title

    Calculation of magnetic flux profiles and deduction of critical current densities for type II superconductors

  • Author

    Cave, J.R. ; Critchlow, P.R. ; Lambert, P. ; Champagne, B.

  • Author_Institution
    VPR Hydro-Quebec, Varennes, Que., Canada
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    1379
  • Lastpage
    1382
  • Abstract
    The critical state concept for the calculation of internal flux profiles in type II superconductors is used to model the magnetization behavior of high-Tc materials. In this application of the model, the field-dependent reversible magnetization and critical current density are incorporated flexibly into numerical solutions of the basic equations. The solutions are compared to results obtained by using the Bean (constant Jc) and Kim (field dependent Jc) approximations. The authors use theoretically calculated magnetization curves to analyze experimental magnetization data for bulk, textured Y/ErBaCuO samples obtained from their own work and from recently published work. Pitfalls and guidelines when using such measurements to obtain intrinsic material critical current densities are discussed
  • Keywords
    barium compounds; critical current density (superconductivity); erbium compounds; high-temperature superconductors; magnetic flux; magnetisation reversal; superconducting transition temperature; type II superconductors; yttrium compounds; YErBaCuO; critical current densities; critical state concept; critical temperatures; field-dependent reversible magnetization; high temperature superconductors; internal flux profiles; magnetic flux profiles; magnetization behavior; type II superconductors; Critical current density; Data analysis; Equations; Guidelines; Magnetic analysis; Magnetic flux; Magnetic materials; Magnetization; Superconducting materials; Type II superconductors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133441
  • Filename
    133441