• DocumentCode
    1103648
  • Title

    Grain alignment and transport properties of Bi2Sr2 CaCu2O8 grown by laser-heated float zone method

  • Author

    Luo, J. ; Jiang, X.P. ; Chow, H.M. ; Cima, M.J. ; Graybeal, J.M. ; Orlando, T.P. ; Rudman, D.A.

  • Author_Institution
    MIT, Cambridge, MA, USA
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    1499
  • Lastpage
    1502
  • Abstract
    A single-phase Bi2Sr2CaCu2O8 bulk superconductor (Tc≃82 K) has been grown by the laser-heated float zone method. The samples are highly textured with the grains. typically 100 μm diameter and 0.5-cm long, and elongated along the crystal a-axis. which is the preferred growth direction. X-ray analysis and transport measurements indicate that all three principal axes (a, b, c) are oriented from grain to grain. The upper limit of the misalignment between the grains is estimated to be less than 2° from the measured anisotropy ratio. The critical current density for such highly textured polycrystalline samples is anisotropic and limited mainly by the weak links at the grain boundaries. The grain boundary effects are examined on the basis of the measured temperature and magnetic field dependence of the critical current
  • Keywords
    X-ray diffraction examination of materials; bismuth compounds; calcium compounds; critical current density (superconductivity); grain boundaries; grain size; high-temperature superconductors; strontium compounds; zone melting; Bi2Sr2CaCu2O8; X-ray analysis; critical current density; grain boundary effects; high temperature superconductor; highly textured; highly textured polycrystalline samples; laser-heated float zone method; transport measurements; weak links; Anisotropic magnetoresistance; Bismuth; Critical current density; Current measurement; Grain boundaries; Magnetic field measurement; Strontium; Temperature dependence; Temperature measurement; X-ray lasers;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133467
  • Filename
    133467