• DocumentCode
    1104669
  • Title

    Experimental microwave-signal-propagation study on GaAs MESFET´s using especially fabricated transistor structures

  • Author

    Fricke, K. ; Hartnagel, H.L.

  • Author_Institution
    Institut für Hochfrequenztechnik, Darmstadt, West Germany
  • Volume
    6
  • Issue
    3
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    151
  • Lastpage
    153
  • Abstract
    Wave-propagation along the electrodes of an FET is reported to be experimentally investigated. A GaAs MESFET with large "gate width" and connecting pads at both ends of the gate and drain electrodes was fabricated. Using S-parameter measurement wave impedances, attenuation- and phase constants were obtained. Based on these measured S-parameters, the loads required at the normally open ends of the gate and the drain lines were calculated in order to achieve a maximally available gain (MAG) for the normal two-port transistor. These calculations are in very good agreement with the experimental results obtained by producing the required free-end loading terminations by tunable loads. It is thus also shown that a significant improvement of the MAG is possible.
  • Keywords
    Attenuation measurement; Electrodes; Gallium arsenide; Impedance measurement; Joining processes; MESFETs; Microwave FETs; Microwave transistors; Phase measurement; Scattering parameters;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1985.26077
  • Filename
    1485230