Equivalent refractive index of MQW waveguides

Author

Saini, Mamta ; Sharma, Enakshi K.

Author_Institution

Dept. of Phys. & Electron., Delhi Univ., India

Volume

32

Issue

8

fYear

1996

fDate

8/1/1996 12:00:00 AM

Firstpage

1383

Lastpage

1390

Abstract

In this paper, we have proposed some new numerical and semi-analytical methods for developing an equivalent three-layer model of an MQW waveguide. The waveguiding properties like effective index, field distribution, and fractional power within the core of the waveguide of these equivalent structures are compared with those of previously reported equivalent methods. These results are also compared with the results obtained from the exact multilayer analysis of the MQW waveguide. The waveguiding properties are accurately predicted by the semi-analytical method using variational analysis, and the computational effort is significantly reduced. The use of the three-layer equivalent is illustrated in obtaining an estimation of the waveguide losses and is used to study the effect of nonlinearity

Keywords

nonlinear optics; numerical analysis; optical films; optical losses; optical waveguide theory; optical waveguides; refractive index; semiconductor quantum wells; variational techniques; MQW waveguides; effective index; equivalent refractive index; equivalent structures; equivalent three-layer model; exact multilayer analysis; field distribution; fractional power; nonlinear optics; nonlinearity; numerical methods; semi-analytical method; semi-analytical methods; three-layer equivalent; variational analysis; waveguide losses; waveguiding properties; Boundary conditions; Nonhomogeneous media; Nonlinear optical devices; Optical losses; Optical materials; Optical modulation; Optical waveguides; Quantum well devices; Refractive index; Tellurium;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.511551

Filename

511551