DocumentCode
1106891
Title
Power dropout statistics of nearly-single-longitudinal-mode semiconductor lasers
Author
Abbas, G.L. ; Yee, T.K.
Author_Institution
M.I.T., Lincoln Lab., Lexington, MA, USA
Volume
21
Issue
9
fYear
1985
fDate
9/1/1985 12:00:00 AM
Firstpage
1303
Lastpage
1307
Abstract
An experimental study of power dropouts in the main mode of a nearly-single-longitudinal-mode GaAlAs semiconductor laser is presented. Knowledge of the statistics of main-mode power dropout interarrival times, depths, and widths is necessary to estimate the performance of a communication system using such laser diodes. We found that at a typical laser operating bias (
), the mean dropout width was 1.8 ns, dropout depths were exponentially distributed, and dropouts falling below 90 percent of the average main-mode power occurred at a rate of
s-1. Also, the rate of dropouts falling below 90 percent of the average main-mode power was found to increase substantially near mode hops, sometimes by several orders of magnitude.
), the mean dropout width was 1.8 ns, dropout depths were exponentially distributed, and dropouts falling below 90 percent of the average main-mode power occurred at a rate of
s-1. Also, the rate of dropouts falling below 90 percent of the average main-mode power was found to increase substantially near mode hops, sometimes by several orders of magnitude.Keywords
Gallium materials/lasers; Laser modes; Laser noise; Pulsed lasers; Communication systems; Detectors; Laser modes; Optical feedback; Optical pulses; Power lasers; Pulse measurements; Semiconductor device noise; Semiconductor lasers; Statistics;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.1985.1072815
Filename
1072815
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