• DocumentCode
    1108133
  • Title

    Comments, with reply, on `Characterization and modeling of mismatch in MOS transistors for precision analog design´

  • Author

    Conroy, C.S.G. ; Lane, W.A. ; Moran, M.A. ; Lakshmikumar, K.R. ; Copeland, M.A.

  • Author_Institution
    Nat. Microelectron. Res. Centre, Univ. Coll., Cork
  • Volume
    23
  • Issue
    1
  • fYear
    1988
  • fDate
    2/1/1988 12:00:00 AM
  • Firstpage
    294
  • Lastpage
    296
  • Abstract
    In a recently published paper by K.R. Lakshmikumar, et al. (see ibid, vol.SC-21, no.6, p.1057-66, 1986) the yield of a digital-to-analog converter (DAC) as a function of component matching is estimated analytically. Here, an assumption inherent to that derivation, namely that the DAC outputs are independent, is questioned and is demonstrated to be inconsistent with Monte-Carlo simulations. The reply of the authors of the original paper is also included
  • Keywords
    digital-analogue conversion; insulated gate field effect transistors; semiconductor device models; DAC outputs; MOS transistors; Monte-Carlo simulations; component matching; digital-to-analog converter; mismatch; modeling; precision analog design; Equations; Hysteresis; Independent component analysis; MOSFETs; Oscillators; RNA; Solid state circuits; Switching circuits; Threshold voltage; Trigger circuits;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.294
  • Filename
    294