• DocumentCode
    1108498
  • Title

    Alpha-particle-induced charge transfer between closely spaced memory cells

  • Author

    Chern, Jue-Shien ; Yang, Ping ; Pattnaik, Pratap ; Seitchik, Jerold A.

  • Author_Institution
    Texas Instruments Incorporated, Dallas, TX
  • Volume
    33
  • Issue
    6
  • fYear
    1986
  • fDate
    6/1/1986 12:00:00 AM
  • Firstpage
    822
  • Lastpage
    834
  • Abstract
    A detailed analysis of various mechanisms involved in α-particle-induced charge transfer between two trench-type DRAM cells is reported. An analytical model has been developed to describe the charge-transfer mechanisms. The charge-collection process consists of two phases. In the first phase, funneling is tile dominant mechanism, and the axial current is calculated based on the drift component. In the second phase, the structure behaves similarly to a bipolar transistor, and both the drift and diffusion components contribute to the charge transfer. A discussion of the dependence of the charge transfer on stored charge, cell separation, charge in the α-particle track, and the substrate doping concentration is presented.
  • Keywords
    Analytical models; Charge transfer; Doping; P-n junctions; Physics; Plasma simulation; Predictive models; Random access memory; Semiconductor process modeling; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1986.22575
  • Filename
    1485792