DocumentCode
1108498
Title
Alpha-particle-induced charge transfer between closely spaced memory cells
Author
Chern, Jue-Shien ; Yang, Ping ; Pattnaik, Pratap ; Seitchik, Jerold A.
Author_Institution
Texas Instruments Incorporated, Dallas, TX
Volume
33
Issue
6
fYear
1986
fDate
6/1/1986 12:00:00 AM
Firstpage
822
Lastpage
834
Abstract
A detailed analysis of various mechanisms involved in α-particle-induced charge transfer between two trench-type DRAM cells is reported. An analytical model has been developed to describe the charge-transfer mechanisms. The charge-collection process consists of two phases. In the first phase, funneling is tile dominant mechanism, and the axial current is calculated based on the drift component. In the second phase, the structure behaves similarly to a bipolar transistor, and both the drift and diffusion components contribute to the charge transfer. A discussion of the dependence of the charge transfer on stored charge, cell separation, charge in the α-particle track, and the substrate doping concentration is presented.
Keywords
Analytical models; Charge transfer; Doping; P-n junctions; Physics; Plasma simulation; Predictive models; Random access memory; Semiconductor process modeling; Solid modeling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1986.22575
Filename
1485792
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