DocumentCode
1108824
Title
21st IEEE International Conference on Microelectronic Test Structures
Volume
7
Issue
2
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
384
Lastpage
384
Abstract
Provides notice of upcoming conference events of interest to practitioners and researchers.
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2007.906617
Filename
4295099
Link To Document