• DocumentCode
    1110994
  • Title

    Recent advances inultra-high-speed HEMT technology

  • Author

    Abe, Masayuki ; Mimura, Takashi ; Nishiuchi, Koichi ; Shibatomi, Akihiro ; Kobayashi, Masaaki

  • Author_Institution
    Fujitsu Laboratories Ltd., Atsugi, Japan
  • Volume
    22
  • Issue
    9
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    1870
  • Lastpage
    1879
  • Abstract
    Current status and recent advances in high electron mobility transistor (HEMT) technology for high-performance VLSI are presented with a focus on material, self-alignment device fabrication, and HEMT LSI implementations. HEMT is a very promising device for ultra-high-speed LSI/VLSI due to the supermobility GaAs/AlGaAs heterojunction structure. The technological challenges for large-scale integration are discussed with the refined HEMT with self-aligned gate structure, controllability of device parameters, and MBE material problems. Master-slave flip-flop divide-by-two circuits achieved an internal logic delay of 22 ps per gate at 77 K at a fan-out of about 2, roughly three times faster than that of GaAs MESFET technology. HEMT has already made it possible to develop a 4 kbit static RAM´s and 1.5 kgate gate array, demonstrating high-speed operations. With submicron gates, as well as advanced material technologies, a HEMT 64 kbit static RAM with subnanosecond access operation and 10 kgate logic LSI with subhundred-picosecond logic delays will be achieved.
  • Keywords
    MODFET logic circuits; MODFET memories; Delay; Fabrication; Gallium arsenide; HEMTs; Heterojunctions; Large scale integration; Logic; MODFETs; Refining; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1986.1073175
  • Filename
    1073175