DocumentCode
1112260
Title
Degradation of Silicone Rubber under AC or DC Voltages in Radiation Environment
Author
Rajini, V. ; Udayakumar, K.
Author_Institution
S.S.N. Coll. of Eng.
Volume
16
Issue
3
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
834
Lastpage
841
Abstract
The aging of silicone rubber by gamma irradiation has been investigated. Silicone Rubber flat specimens were aged by gamma irradiation with three different doses and the resistance to tracking on applying ac and dc voltages was examined. The results show that the resistance to tracking under dc voltages is less than that of their ac values. This necessitates a separate standard for determination of tracking resistance under dc voltage. Laboratory examination of material changes together with visual observations and leakage current measurements were also made. The dc stressed samples showed a higher surface degradation compared to those stressed by ac voltages. The erosion depth and contact angle affected by radiation have been studied. The aging of the surface was assessed by Fourier Transform Infrared Spectroscopy and Scanning Electron Microscopy with Energy Dispersive X-ray Analysis.
Keywords
Fourier transform spectroscopy; X-ray chemical analysis; contact angle; gamma-rays; infrared spectroscopy; polymer insulators; scanning electron microscopy; silicone rubber; AC voltage; DC voltage; Fourier transform infrared spectroscopy; aging; contact angle; energy dispersive X-ray analysis; gamma irradiation; radiation environment; scanning electron microscopy; silicone rubber; Aging; Current measurement; Degradation; Electrical resistance measurement; Fourier transforms; Laboratories; Leakage current; Rubber; Surface resistance; Voltage; Silicone rubber (SR), Gamma radiation, γ radiation, dc resistance to tracking, contact angle, erosion depth, Fourier transform infrared spectroscopy (FTIR), Scanning electron microscopy, Energy dispersive X-ray analysis, EDXA, Alumina tri hydrate, ATH;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2009.5128524
Filename
5128524
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